sikod logo
sikod wafer background
Your premier source of semiconductor news
Warning: include(searchbar.html) [function.include]: failed to open stream: No such file or directory in /home4/oswebtw2/public_html/sikod/home/ieee_reliability_packaging.php on line 18
Warning: include() [function.include]: Failed opening 'searchbar.html' for inclusion (include_path='.:/usr/lib64/php:/usr/lib/php') in /home4/oswebtw2/public_html/sikod/home/ieee_reliability_packaging.php on line 18
IEEE Device & Materials Reliabilty
- Front cover
June 1st, 2010 12:00 AM - IEEE Transactions on Device and Materials Reliability publication information
June 1st, 2010 12:00 AM - Table of Contents
June 1st, 2010 12:00 AM - Characterization of NBTI-Induced Interface State and Hole Trapping in SiON Gate Dielectrics of p-MOSFETs
June 1st, 2010 12:00 AM - Effects of Moist Environments on LED Module Reliability
June 1st, 2010 12:00 AM - Understanding the Mechanisms of Degradation and Failure Observed in ESD Protection Devices Under System-Level Tests
June 1st, 2010 12:00 AM - Optimizing Scrubbing Sequences for Advanced Computer Memories
June 1st, 2010 12:00 AM - Limitations of Poole–Frenkel Conduction in Bilayer
June 1st, 2010 12:00 AM - Robust Register Caching: An Energy-Efficient Circuit-Level Technique to Combat Soft Errors in Embedded Processors
June 1st, 2010 12:00 AM - Modeling of Barrier-Engineered Charge-Trapping
nand Flash Devices
June 1st, 2010 12:00 AM - Low-Operating-Voltage Polymer Thin-Film Transistors Based on Poly(3-Hexylthiophene) With Hafnium Oxide as the Gate Dielectric
June 1st, 2010 12:00 AM - Optimization on Layout Style of ESD Protection Diode for Radio-Frequency Front-End and High-Speed I/O Interface Circuits
June 1st, 2010 12:00 AM - Study of Random Dopant Fluctuation Effects in FD-SOI MOSFET Using Analytical Threshold Voltage Model
June 1st, 2010 12:00 AM - Unusual Observations in the Wear-Out of High-Purity Aluminum Wire Bonds Under Extended Range Passive Thermal Cycling
June 1st, 2010 12:00 AM - Models With Failure-Free Life—Applied Review and Extensions
June 1st, 2010 12:00 AM
IEEE Trans. Reliability
- Table of contents
June 1st, 2010 12:00 AM - IEEE Transactions on Reliability publication information
June 1st, 2010 12:00 AM - Selection of Optimal Software Reliability Growth Models Using a Distance Based Approach
June 1st, 2010 12:00 AM - Anomaly Detection Through a Bayesian Support Vector Machine
June 1st, 2010 12:00 AM - Analytic Confusion Matrix Bounds for Fault Detection and Isolation Using a Sum-of-Squared-Residuals Approach
June 1st, 2010 12:00 AM - A Framework for Reliability Approximation of Multi-State Weighted
June 1st, 2010 12:00 AM - Dynamic Bayesian Evaluation Method for System Reliability Growth Based on In-Time Correction
June 1st, 2010 12:00 AM - Exact Reliability Formula for Consecutive-
June 1st, 2010 12:00 AM - Lifetime Reliability for Load-Sharing Redundant Systems With Arbitrary Failure Distributions
June 1st, 2010 12:00 AM - Tolerance Limits for
June 1st, 2010 12:00 AM - Computing Multi-State Two-Terminal Reliability Through Critical Arc States That Interrupt Demand
June 1st, 2010 12:00 AM - Modeling Failure Modes for Residual Life Prediction Using Stochastic Filtering Theory
June 1st, 2010 12:00 AM - Optimal Selective Maintenance Strategy for Multi-State Systems Under Imperfect Maintenance
June 1st, 2010 12:00 AM - Repair and Replacement Decisions for Warranted Products Under Markov Deterioration
June 1st, 2010 12:00 AM - A Periodic Replacement Model Based on Cumulative Repair-Cost Limit for a System Subjected to Shocks
June 1st, 2010 12:00 AM
Copyright © 2006-2008. SiKOD.com. All right reserved.
This website is designed and maintained by OSWeb2Design
This website is designed and maintained by OSWeb2Design